A very cost-effective solution for ESD protection in USB 2.0/3.0 applications is to combine an internal ESD protection structure (integrated in the USB transceiver) with a robust, high-current ...
As semiconductor manufacturers introduce new wireline transmission devices built on smaller CMOS geometries, more circuit protection challenges are emerging. This article explores five frequently ...
A study to evaluate the applicability of IEC-61000-4-2 testing at the semiconductor device level finds that results depend more on variations in test setup than in ESD sensitivity. Donna Robinson-Hahn ...
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