A new technique that combines electron microscopy and laser technology enables programmable, arbitrary shaping of electron beams. It can potentially be used for optimizing electron optics and for ...
Scientists at the Paul Scherrer Institute PSI have, for the first time, demonstrated a technique that synchronizes ultrashort ...
A graphene-based “beam splitter” for electronic currents has been built by researchers in France, South Korea, and Japan. Created by Preden Roulleau at the University of Paris and colleagues, the ...
Over the last 20 years, the proliferation of research utilizing scanning electron microscopy (SEM) has driven the performance of systems towards higher resolution at lower voltages. This enthusiasm is ...
SIG SAUER Electro-Optics is now shipping the OSCAR8 HDX Variable Power Spotting Scope. With more power, magnification, and the latest advancements in technology the OSCAR8 is a premium, angled ...
Unlike the electron beam used in scanning and transmission electron microscopy (SEM, TEM), the beam in a focused ion beam system (FIB) is composed of gallium (Ga) ions. The ions forming the structure ...
(1) MR. MYERS is to be complimented on producing the first book on the subject to be published in Great Britain, and a truly comprehensive and readable book. He has spared no pains in bringing the ...
New company, part of II-VI Inc., renamed LightWorks Optical Systems. MURRIETA, Calif.--(BUSINESS WIRE)--Exotic Electro-Optics, Inc. (EEO) and LightWorks Optics, Inc. (LWO) today announced the ...
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