TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951)(President & COO Izumi Oi) announces the development and release of a new scanning electron microscope (SEM), the JSM-IT510 series, in November 2021.
TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...
JEOL, in partnership with San Joaquin Delta Colleges School of Electron Microscopy, has configured remote viewing and remote-control microscopy on Delta’s innovative 1400Flash. The 1400Flash marks an ...
Dublin, Oct. 30, 2020 (GLOBE NEWSWIRE) -- The "Cryo-electron Microscopy Market Insights 2020 - Analysis and Forecasts for the Global and Chinese Markets to 2025, by Manufacturers, Regions, Technology, ...
This instrument is an ultra-high-resolution scanning electron microscope capable of secondary-electron image resolution of 1.2 nm. It is fully digital and incorporates an image archiving computer.
The University of Oxford’s Department of Materials has introduced a custom-built £3 million Transmission Electron Microscope (TEM), marking a significant advancement in microscopy. The JEOL ...
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