Experts at the Table: Semiconductor Engineering sat down to discuss the rapidly changing landscape of design for testability (DFT), focusing on the impact of advancements in fault models, high-speed ...
Researchers from China University of Petroleum (East China), in collaboration with international partners, have reported a ...
When existing advanced 2D designs already push the limits of design-for-test (DFT) tools, what hope do developers have of managing DFT for 3D devices? Can anyone afford the tool run time, on-chip area ...
These days, due to the ever increasing complexity of devices and the demand for better product quality, it is vital that ICs are tested as quickly and as efficiently as possible. Test engineers are ...
There are many books and articles on the Fourier Transform and its implementation available. A quick survey of these resources shows that they are not geared to the needs of the “Practicing ...
In today’s fast growing Systems-on-Chip (SoC), incomplete or ineffective DFT support due to poor specification or loose design practices can quickly become the critical path to making market windows ...
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