Quality starts with process: Addressing common gaps in software testing

Software quality often slips not because of major flaws, but because of small cracks in the software development lifecycle ...
IEEE

Spatial Modeling with Automated Machine Learning and Gaussian Process Regression Techniques for Imputing Wafer Acceptance Test Data

Abstract: The Wafer Acceptance Test (WAT) is a significant quality control measurement in the semiconductor industry. However, because the WAT process can be time-consuming and expensive, sampling ...
federalnewsnetwork.com

‘A huge test for the IRS’: Senators warn shrinking workforce may hamper upcoming filing season

The IRS is weeks away from the start of a busier-than-usual filing season. But a group of senators is warning that the agency may be stretched too thin after losing more than a quarter of its ...
IEEE

Adaptive Accelerated Degradation Test Design for Tweedie Exponential Dispersion Process With Random Effects Based on the Predictive Remaining Useful Life

Abstract: The Tweedie exponential dispersion (TED) process provides a flexible framework for degradation process modeling. To obtain degradation information quickly and realistically, we focus on the ...