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SOLVED: A visual inspection of a location on wafers from a semiconductor manufacturing process resulted in the followingtable: No.of Contamination Proportion No.of Contamination Proportion Particles of Wafers Particles of Wafers 0 0.40 3 0.10 1 0.20 4 0.05 2 0.15 5 or more 0.10 What is the probability that a wafer contains three or more particles in the inspected location? A0.12 C. 0.25 B.0.20 D. 0.15
SOLVED: A visual inspection of a location on wafers from a semicon…
Jan 18, 2024
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